Answer:
the critical flaw is subject to detection since this value of ac (16.8 mm) is greater than the 3.0 mm resolution limit.
Explanation:
This problem asks that we determine whether or not a critical flaw in a wide plate is subject to detection given the limit of the flaw detection apparatus (3.0 mm), the value of KIc (98.9 MPa m), the design stress (sy/2 in which s y = 860 MPa), and Y = 1.0.
[tex]ac=1/\pi (\frac{Klc}{Ys} )^{2}\\ ac=1/\pi(\frac{98.9}{(1)(860/2)} )^{2}\\ ac=0.0168m\\ac=16.8mm[/tex]
Therefore, the critical flaw is subject to detection since this value of ac (16.8 mm) is greater than the 3.0 mm resolution limit.
